 | Raman image galleryAll of the images on this page have been generated using Renishaw's inVia microRaman system powered by Renishaw's WiRE™ software. These examples represent only a limited selection of the comprehensive imaging capabilities available to users of these systems. Renishaw customers are invited to have their Raman images included in the gallery by contacting their local sales representative. Pharmaceutical tabletTablet dissolution behaviour correlated to distribution and concentration of tablet components
Map area: 6 mm x 12 mm Spectra generated: 82,000 Acquisition time: 38 minutes
StreamLine™ Plus image showing the distribution of ingredients in a pharmaceutical tablet Map area: 6 mm x 12 mm Spectra generated: 82,000 Acquisition time: 38 minutes Multi-layered graphene sample
StreamLine™ Plus image showing the distribution of different thicknesses within a graphene flake Map area: 110 µm x 120 µm Spectra generated: 40,000 Acquisition time: 14 minutes CVD diamond film
Images show information on crystal shape, orientation, stresses and defect densities. Map area: 175 µm x 88 µm Spectra generated: 51,200 Acquisition time: 2 imaging experiments, 15 minutes each (first acquisition used to generate three Raman images, second acquisition used to generate photoluminescence image). Image 1: Raman image showing 1 cm-1 variation in position of the 1332 cm-1 diamond band Image 2: Raman image showing 2 cm-1 variation in width of the 1332 cm-1 diamond band Image 3: Raman image showing variation in peak area of the 1332 cm-1 diamond band Image 4: Photoluminescence image showing variation in the intensity of the 1.68 eV neutral silicon vacancy [Si-V]0 band. Micro indentation in silicon wafer
Peak position derived from curve-fit analysis Map area: 10 µm x 10 µm Spectra generated: 10,000 Acquisition time: 36 minutes (single acquisition analysed for both images) Scan details: 100 nm step achieved using piezoelectric scanning stage
Peak width derived from curve-fit analysis Sandstone from Loch Torridon, Scotland
Area of section: 500 µm x 320 µm Spectra generated: 67,200 Acquisition time: 20 minutes Polymer laminate (PS and PMMA)
Map area: 240 µm x 645 µm Spectra generated: 17,200 Acquisition time: 7 minutes Strained Si-Ge cross-hatch
Map area: 129 µm x 130 µm Spectra generated: 55,000 Acquisition time: 13 minutes Tooth section
Map area: 9 mm x 16 mm Spectra generated: 84,000 Acquisition time: 20 minutes Laser induced crystalline silicon tracks
Map area: 550 µm x 550 µm Spectra generated: 70,000 Acquisition time: 17 minutes
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Tablet from production batch 1
Tablet from production batch 2
Graphene monolayer, bilayer and other multiple-layer regions identified
Polished surface of polycrystalline diamond film grown by CVD technique
Peak position
Peak width
StreamLine™ Plus image showing the distribution of Anatase (TiO2) (red), Quartz (SiO2) (green) and Haematite (Fe2O3) (blue)
StreamLine™ Plus image of polymer laminate sample showing the distribution of PMMA (red), epoxy (green) and PS (blue)
StreamLine™ Plus image of a Si-Ge semiconductor sample exhibiting a strained structure. The map shows variation in the Si-Si 510 cm-1 band position (~ 0.2 cm-1 positional band shift). The map data were generated using curve fitting.
StreamLine™ Plus image of a sectioned tooth, highlighting the enamel (green), dentine (blue) and areas of high fluorescence (red)
StreamLine™ Plus image of laser induced crystalline silicon tracks on amorphous substrate
Zoomed region (~ 250 µm x 250 µm) of above image